Today’s tight quality control specifications pose challenges to micro and macro detection, as well as metrology. Orbotech’s offline systems are specifically designed to successfully meet these challenges. SuperVision is the ultimate offline AOI system. Its unique design coupled with years invested in R&D and the enhancement of its image processing algorithms result in extremely sensitive detection with high throughput. Offering CD/Overlay and Digital Macro functions and Peripheral inspection, SuperVision offers exceptional cost performance enhancement for the entire production line.

SuperVision AOI systems together  with the long established and proficient FPI- 7000 and FPI-6000 AOI series, provide high-sensitivity scan, microscopic video images, classification, CD/ Overlay measurements, Macro (Mura) inspection and many more features, to contribute to and dramatically improve manufacturers' yield enhancement. Offering inspection of Gen 4 through to the largest glass sizes, together with its integrated metrology functions, Orbotech’s offline AOI systems are the offline inspection and metrology solutions of choice.