You are in:
Printed Circuit Boards
Flat Panel Displays
Array Test Systems
Array Repair Systems
Automated Optical Inspection
Value Added Applications
+ Orbotech ClearSight™
+ Peripheral Inspection
+ Macro Inspection
+ Metrology
+ Defect Classification
Process Information & Classification
Orbotech FPD Academy
Customer Support
Medical Imaging
Peripheral Inspection
Full Inspection and Defect Detection for Peripheral Circuit Areas
Orbotech's Peripheral Inspection technology extends the capabilities of the AOI solutions by enabling a complete panel inspection, and defect detection in the peripheral circuit areas. Manufacturers can look for flaws in driver circuitry, pad areas and other integrated electronics. Applying our dedicated algorithms combined with an advanced GUI, Orbotech Peripheral Inspection provides comprehensive yield management to almost 100% of any panel area.
Highlights:
  • Inspection of the entire active area of the glass at the same TACT
  • Programmable User Interface

Benefits:
  • Improves total yield
  • Provides comprehensive detection of electronic circuits across the entire glass
  • Reduces the need for additional electrical testing
Terms of use Sitemap Copyright © 2008 Orbotech Ltd. All rights reserved.